Yun, Ilgu : rechercher sur Z-Library

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1

Methodology for improvement of data retention in floating gate flash memory using leakage current estimation

Moon, Pyung, Lim, Jun Yeong, Youn, Tae-Un, Noh, Keum-Whan, Park, Sung-Kye, Yun, Ilgu

Journal:

Microelectronics Reliability

Année:

2013

Langue:

english

Fichier:

PDF, 1.06 MB

english, 2013

2

Impact of process variability in junctionless FinFETs due to random dopant fluctuation, gate work function variation, and oxide thickness variation

Bae, Min Soo, Yun, Ilgu

Journal:

Semiconductor Science and Technology

Année:

2020

Langue:

english

Fichier:

PDF, 898 KB

english, 2020

3

Modeling of In2O3-10 wt% ZnO thin film properties for transparent conductive oxide using neural networks

Chang Eun Kim, Hyun Soo Shin, Pyung Moon, Hyun Jae Kim, Ilgu Yun

Journal:

Current Applied Physics

Année:

2009

Langue:

english

Fichier:

PDF, 795 KB

english, 2009

4

Optical bandgap modeling of thermal annealed ZnO:Ga thin films using neural networks

Chang Eun Kim, Pyung Moon, Ilgu Yun, Sungyeon Kim, Jae-Min Myoung, Hyeon Woo Jang, Jungsik Bang

Journal:

physica status solidi (a)

Année:

2010

Langue:

english

Fichier:

PDF, 578 KB

english, 2010

5

Effects of channel thickness variation on bias stress instability of InGaZnO thin-film transistors

Edward Namkyu Cho, Jung Han Kang, Ilgu Yun

Journal:

Microelectronics Reliability

Année:

2011

Langue:

english

Fichier:

PDF, 667 KB

english, 2011

6

Modeling and analysis of 3-D solenoid embedded inductors

Seogoo Lee,, Jongseong Choi,, May, G.S., Ilgu Yun,

Journal:

IEEE Transactions on Electronics Packaging Manufacturing

Année:

2002

Langue:

english

Fichier:

PDF, 379 KB

english, 2002

7

Degradation Mechanisms of Amorphous InGaZnO Thin-Film Transistors Used in Foldable Displays by Dynamic Mechanical Stress

Lee, Sang Myung, Shin, Dongseok, Yun, Ilgu

Journal:

IEEE Transactions on Electron Devices

Année:

2017

Langue:

english

Fichier:

PDF, 1.90 MB

english, 2017

8

Analytical Model for Junctionless Double-Gate FET in Subthreshold Region

Shin, Yong Hyeon, Weon, Sungwoo, Hong, Daesik, Yun, Ilgu

Journal:

IEEE Transactions on Electron Devices

Année:

2017

Langue:

english

Fichier:

PDF, 1.69 MB

english, 2017

9

thermal modeling of 7-nm-Node bulk FinFETs for device structure-aware design

Park, Chuntaek, Yun, Ilgu

Journal:

Semiconductor Science and Technology

Année:

2018

Langue:

english

Fichier:

PDF, 1.57 MB

english, 2018

10

Neural network modeling of the cellgap process for liquid crystal display fabricated on plastic substrates

Jung Hwan Lee, Dong-Hun Kang, Young-Don Ko, Jaejin Jang, Dae-Shik Seo, Ilgu Yun

Journal:

Expert Systems with Applications

Année:

2008

Langue:

english

Fichier:

PDF, 692 KB

english, 2008

11

Reliability assessment of 1.55-μm vertical cavity surface emitting lasers with tunnel junction using high-temperature aging tests

Keun Ho Rhew, Su Chang Jeon, Dae Hee Lee, Byueng-Su Yoo, Ilgu Yun

Journal:

Microelectronics Reliability

Année:

2009

Langue:

english

Fichier:

PDF, 510 KB

english, 2009

12

Effect of carrier concentration on optical bandgap shift in ZnO:Ga thin films

Chang Eun Kim, Pyung Moon, Sungyeon Kim, Jae-Min Myoung, Hyeon Woo Jang, Jungsik Bang, Ilgu Yun

Journal:

Thin Solid Films

Année:

2010

Langue:

english

Fichier:

PDF, 428 KB

english, 2010

13

Zinc diffusion process investigation of InP-based test structures for high-speed avalanche photodiode fabrication

Ilgu Yun, Kyung-Sook Hyun

Journal:

Microelectronics Journal

Année:

2000

Langue:

english

Fichier:

PDF, 325 KB

english, 2000

14

Neural network based modeling of diffusion process for high-speed avalanche photodiodes fabrication

Young-Don Ko, Yong Hwan Kwon, Kyung Sook Hyun, Changhyun Yi, Ilgu Yun

Journal:

Microelectronics Journal

Année:

2002

Langue:

english

Fichier:

PDF, 211 KB

english, 2002

15

Annealing effect on the structural and optical properties of ZnO thin film on InP

Eun Sub Shim, Hong Seong Kang, Seong Sik Pang, Jeong Seok Kang, Ilgu Yun, Sang Yeol Lee

Journal:

Materials Science and Engineering: B

Année:

2003

Langue:

english

Fichier:

PDF, 192 KB

english, 2003

16

Modeling and optimization of ITO/Al/ITO multilayer films characteristics using neural network and genetic algorithm

Edward Namkyu Cho, Pyung Moon, Chang Eun Kim, Ilgu Yun

Journal:

Expert Systems with Applications

Année:

2012

Langue:

english

Fichier:

PDF, 1014 KB

english, 2012

17

Experimental observation of gate geometry dependent characteristic degradations of the multi-finger MOSFETs

Mingu Kang, Ilgu Yun

Journal:

Microelectronics Reliability

Année:

2012

Langue:

english

Fichier:

PDF, 428 KB

english, 2012

18

Threshold voltage shift prediction for gate bias stress on amorphous InGaZnO thin film transistors

Suehye Park, Edward Namkyu Cho, Ilgu Yun

Journal:

Microelectronics Reliability

Année:

2012

Langue:

english

Fichier:

PDF, 1.05 MB

english, 2012

19

Reliability of planar InP-InGaAs avalanche photodiodes with recess etching

Jihoun Jung, Yong Hwan Kwon, Kyung Sook Hyun, Ilgu Yun

Journal:

IEEE Photonics Technology Letters

Année:

2002

Langue:

english

Fichier:

PDF, 205 KB

english, 2002

20

Effects of Electrical Characteristics on the Non-Rectangular Gate Structure Variations for the Multifinger MOSFETs

Chulhyun Park, Youngkyu Song, Jung Han Kang, Seong-Ook Jung, Ilgu Yun

Journal:

IEEE Transactions on Components Packaging and Manufacturing Technology

Année:

2011

Langue:

english

Fichier:

PDF, 1.11 MB

english, 2011

21

Device characteristics of Ti–InSnO thin film transistors with modulated double and triple channel structures

Kim, Chang Eun, Yun, Ilgu

Journal:

Thin Solid Films

Année:

2013

Langue:

english

Fichier:

PDF, 673 KB

english, 2013

22

Field-dependent charge trapping analysis of ONO inter-poly dielectrics for NAND flash memory applications

Moon, Pyung, Lim, Jun Yeong, Youn, Tae-Un, Park, Sung-Kye, Yun, Ilgu

Journal:

Solid-State Electronics

Année:

2014

Langue:

english

Fichier:

PDF, 1.34 MB

english, 2014

23

Conduction instability of amorphous InGaZnO thin-film transistors under constant drain current stress

Kang, Jung Han, Cho, Edward Namkyu, Yun, Ilgu

Journal:

Microelectronics Reliability

Année:

2014

Langue:

english

Fichier:

PDF, 1.00 MB

english, 2014

24

Analysis of Bias Stress Instability in Amorphous InGaZnO Thin-Film Transistors

Cho, Edward Namkyu, Kang, Jung Han, Kim, Chang Eun, Moon, Pyung, Yun, Ilgu

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2011

Langue:

english

Fichier:

PDF, 706 KB

english, 2011

25

[IEEE 2008 33rd IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) - Penang, Malaysia (2008.11.4-2008.11.6)] 2008 33rd IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) - Ink-jet printing process modeling using neural networks

Moon, Pyung, Chang Eun Kim,, Dongjo Kim,, Jooho Moon,, Ilgu Yun,

Année:

2008

Langue:

english

Fichier:

PDF, 1.67 MB

english, 2008

26

An analytical avalanche breakdown model for double gate MOSFET

Cho, Edward Namkyu, Shin, Yong Hyeon, Yun, Ilgu

Journal:

Microelectronics Reliability

Année:

2015

Langue:

english

Fichier:

PDF, 1.30 MB

english, 2015

27

Electrode metal penetration of amorphous indium gallium zinc oxide semiconductor thin film transistors

Ka, Jihyun, Cho, Edward Namkyu, Lee, Min-Jung, Myoung, Jae-Min, Yun, Ilgu

Journal:

Current Applied Physics

Année:

2015

Langue:

english

Fichier:

PDF, 1.43 MB

english, 2015

28

Effect of electric field polarity on inter-poly dielectric during cell operation for the retention characteristics

Moon, Pyung, Lim, Jun Yeong, Youn, Tae-Un, Noh, Keum-Whan, Yun, Ilgu

Journal:

Microelectronics Reliability

Année:

2015

Langue:

english

Fichier:

PDF, 1.07 MB

english, 2015

29

Design of red-emitting external cavity diode laser module for high-slope efficiency and narrow bandwidth

Park, Jiyeon, Song, Hong Joo, Na, Hong Man, Lee, Jun Ho, Yun, Ilgu

Journal:

Optical Engineering

Année:

2015

Langue:

english

Fichier:

PDF, 1.98 MB

english, 2015

30

Analysis of Intrinsic Charge Loss Mechanisms for Nanoscale nand Flash Memory

Lim, Jun Yeong, Moon, Pyung, Lee, Sang Myung, Noh, Keum-Whan, Youn, Tae-Un, Kim, Jong-Wook, Yun, Ilgu

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2015

Langue:

english

Fichier:

PDF, 1.12 MB

english, 2015

31

Reliability modeling and analysis of flicker noise for pore structure in amorphous chalcogenide-based phase-change memory devices

Lim, Jun Yeong, Yun, Ilgu

Journal:

Microelectronics Reliability

Année:

2015

Langue:

english

Fichier:

PDF, 519 KB

english, 2015

32

Photodiodes - From Fundamentals to Applications || Fabrication of Crystalline Silicon Solar Cell with Emitter Diffusion, SiNx Surface Passivation and Screen Printing of Electrode

Année:

2012

Langue:

english

Fichier:

PDF, 7.76 MB

english, 2012

33

Real-time plasma monitoring technique using incident-angle-dependent optical emission spectroscopy for computer-integrated manufacturing

Kim, In Joong, Yun, Ilgu

Journal:

Robotics and Computer-Integrated Manufacturing

Année:

2018

Langue:

english

Fichier:

PDF, 2.59 MB

english, 2018

34

[IEEE 2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) - Prague, Czech Republic (2018.7.2-2018.7.5)] 2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) - Compact Drain Current Model of Nanoscale FinFET Considering Short Channel Effect in Ballistic Transport Regime

Bae, Min Soo, Park, Chuntaek, Yun, Ilgu

Année:

2018

Langue:

english

Fichier:

PDF, 503 KB

english, 2018

35

Printed Electronics - Current Trends and Applications || Screen‐Printed Front Junction n‐Type Silicon Solar Cells

Année:

2016

Langue:

english

Fichier:

PDF, 8.31 MB

english, 2016

36

Printed Electronics - Current Trends and Applications || Introductory Chapter: Printed Electronics

Année:

2016

Fichier:

PDF, 154 KB

2016

37

Fabrication of rough Al doped ZnO films deposited by low pressure chemical vapor deposition for high efficiency thin film solar cells

Doyoung Kim, Ilgu Yun, Hyungjun Kim

Journal:

Current Applied Physics

Année:

2010

Langue:

english

Fichier:

PDF, 938 KB

english, 2010

38

Neural network based modeling of HfO2 thin film characteristics using Latin Hypercube Sampling

Kyoung Eun Kweon, Jung Hwan Lee, Young-Don Ko, Min-Chang Jeong, Jae-Min Myoung, Ilgu Yun

Journal:

Expert Systems with Applications

Année:

2007

Langue:

english

Fichier:

PDF, 1.01 MB

english, 2007

39

Investigation of manufacturing variations of planar InP/InGaAs avalanche photodiodes for optical receivers

Bongyong Lee, Hongil Yoon, Kyung Sook Hyun, Yong Hwan Kwon, Ilgu Yun

Journal:

Microelectronics Journal

Année:

2004

Langue:

english

Fichier:

PDF, 391 KB

english, 2004

40

Degradation analysis in asymmetric sampled grating distributed feedback laser diodes

Han Sung Joo, Sang-Wan Ryu, Jeha Kim, Ilgu Yun

Journal:

Microelectronics Journal

Année:

2007

Langue:

english

Fichier:

PDF, 236 KB

english, 2007

41

Characteristics and processing effects of ZrO2 thin films grown by metal-organic molecular beam epitaxy

Myoung-Seok Kim, Young-Don Ko, Jang-Hyuk Hong, Min-Chang Jeong, Jae-Min Myoung, Ilgu Yun

Journal:

Applied Surface Science

Année:

2004

Langue:

english

Fichier:

PDF, 357 KB

english, 2004

42

Growth and characterization of MOMBE grown HfO2

Tae-Hyoung Moon, Moon-Ho Ham, Myoung-Seok Kim, Ilgu Yun, Jae-Min Myoung

Journal:

Applied Surface Science

Année:

2005

Langue:

english

Fichier:

PDF, 267 KB

english, 2005

43

Photoluminescence study of InGaN/GaN multiple-quantum-well with Si-doped InGaN electron-emitting Layer

Soon Il Jung, Ilgu Yun, Chang Myung Lee, Joo In Lee

Journal:

Current Applied Physics

Année:

2009

Langue:

english

Fichier:

PDF, 417 KB

english, 2009

44

Contact resistance dependent scaling-down behavior of amorphous InGaZnO thin-film transistors

Edward Namkyu Cho, Jung Han Kang, Ilgu Yun

Journal:

Current Applied Physics

Année:

2011

Langue:

english

Fichier:

PDF, 835 KB

english, 2011

45

Modeling and optimization of the growth rate for ZnO thin films using neural networks and genetic algorithms

Young-Don Ko, Pyung Moon, Chang Eun Kim, Moon-Ho Ham, Jae-Min Myoung, Ilgu Yun

Journal:

Expert Systems with Applications

Année:

2009

Langue:

english

Fichier:

PDF, 276 KB

english, 2009

46

Neural network based modeling of PL intensity in PLD-grown ZnO thin films

Young-Don Ko, Hong Seong Kang, Min-Chang Jeong, Sang Yeol Lee, Jae-Min Myoung, Ilgu Yun

Journal:

Journal of Materials Processing Technology

Année:

2005

Langue:

english

Fichier:

PDF, 194 KB

english, 2005

47

Statistical modeling of the electrical characteristics for HfO2 thin films grown by MOMBE for high-k dielectric applications

Jung Hwan Lee, Kyoung Eun Kweon, Young-Don Ko, Tae-Hyoung Moon, Jae-Min Myoung, Ilgu Yun

Journal:

Journal of Materials Processing Technology

Année:

2008

Langue:

english

Fichier:

PDF, 853 KB

english, 2008

48

Effects of post-metallization annealing of high-K dielectric thin films grown by MOMBE

Minseong Yun, Myoung-Seok Kim, Young-Don Ko, Tae-Hyoung Moon, Jang-Hyuk Hong, Jae-Min Myoung, Ilgu Yun

Journal:

Microelectronic Engineering

Année:

2005

Langue:

english

Fichier:

PDF, 531 KB

english, 2005

49

Modeling growth rate of HfO2 thin films grown by metal–organic molecular beam epitaxy

Myoung-Seok Kim, Young-Don Ko, Tae-Houng Moon, Jae-Min Myoung, Ilgu Yun

Journal:

Microelectronics Journal

Année:

2006

Langue:

english

Fichier:

PDF, 665 KB

english, 2006

50

Characterization and process effects of HfO2 thin films grown by metal-organic molecular beam epitaxy

Myoung-Seok Kim, Young-Don Ko, Minseong Yun, Jang-Hyuk Hong, Min-Chang Jeong, Jae-Min Myoung, Ilgu Yun

Journal:

Materials Science and Engineering: B

Année:

2005

Langue:

english

Fichier:

PDF, 657 KB

english, 2005